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iMak AI Lab

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© 2026 iMak AI Lab

Publications

A collection of key scientific and applied works of the laboratory. In the future, the list can be linked to an external database or Google Scholar.

2026

AI-Driven Calibration for FMCW-Interferometry Clamp-on Ultrasonic Sensors

Ivan Korelin, Ilya Bolkisev, Aleksandr Kovalenko, Ilya Makarov, Alexey Kalmykov, Mikhail Ronkin

2026 ACM/IEEE International Conference on Embedded Artificial Intelligence and Sensing Systems - Posters and Demos (SenSys-Adjunct)•May 2026
Industrial AIIoTSensor NetworksEdge AISenSys
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2026

Interactive Framework for Interpretable Fault Diagnosis with Graph Neural Networks

Alexander Kozhevnikov, Maria Shtark, Petr Ivanov, Aleksandr Kovalenko, Dmitry Zhevnenko, Viacheslav Vasilev,

2026 ACM/IEEE International Conference on Embedded Artificial Intelligence and Sensing Systems - Posters and Demos (SenSys-Adjunct)•May 2026
GNNFault DiagnosisExplainable AIIndustrial AISenSys
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2026

MemSARAD: Hybrid Spatial-Memory Modeling for Industrial Sensing Systems

Alina Kozhevnikova, Andrei Zakharov, Ilya Makarov

2026 ACM/IEEE International Conference on Embedded Artificial Intelligence and Sensing Systems - Posters and Demos (SenSys-Adjunct)•May 2026
Anomaly DetectionIndustrial AIIoTTime Series AnalysisSenSys
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2026

On-Device Real-Time Computer Vision System for Rock Fragmentation Estimation in Open-Pit Mining

Artem Sorokin, Kirill Reshetnikov, Aleksandr Kovalenko, Ilya Makarov, Mikhail Ronkin

2026 ACM/IEEE International Conference on Embedded Artificial Intelligence and Sensing Systems - Posters and Demos (SenSys-Adjunct)•May 2026
CVEdge AIMiningIndustrial AISenSys
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2026

From Images to Decisions: Assistive Computer Vision for Non-Metallic Content Estimation in Scrap Metal

Daniil Storonkin, Ilia Dziub, Maksim Golyadkin, Ilya Makarov

arXiv preprint arXiv:2602.07062•February 2026
CVImage SegmentationMetallurgyIndustrial AIarXiv
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2025

Automation of input control of transistors using deep learning models and analysis of their latent space

AS Chernova, Fedor Pavlovich Meshchaninov, Dmitry Zhevnenko, Evgenii Sergeevich Gornev

Doklady Rossijskoj Akademii Nauk. Mathematika, Informatika, Processy Upravlenia•September 2025
DOI: https://doi.org/10.7868/S2686954325070239
MicroelectronicsAnomaly DetectionIndustrial AIRepresentation Learning
2025

Optimizing state monitoring with domain degradation knowledge

Dmitry Zhevnenko, Ilya Makarov

IEEE Access•May 2025
DOI: https://doi.org/10.1109/ACCESS.2025.3573683
predictive maintenanceRULIndustrial AIIEEE Access
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2025

SensorDBSCAN: Semi-Supervised Active Learning Powered Method for Anomaly Detection and Diagnosis

Petr Ivanov, Maria Shtark, Alexander Kozhevnikov, Maksim Golyadkin, Dmitry Botov, Ilya Makarov

IEEE Access•February 2025
DOI: https://doi.org/10.1109/ACCESS.2025.3537649
Anomaly DetectionFault DiagnosisActive LearningIndustrial AIIEEE Access
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