Benchmarking 2D Latent Degradation Spaces for Monitoring-Ready PdM
2026 ACM/IEEE International Conference on Embedded Artificial Intelligence and Sensing Systems - Posters and Demos (SenSys-Adjunct)•May 2026
A collection of key scientific and applied works of the laboratory. In the future, the list can be linked to an external database or Google Scholar.
Dmitry Zhevnenko, Ilya Makarov, Petr Michailov